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Characterization of Crystal Growth Defects by X-ray Methods / ed. Brian K. Tanner, D. Keith Bowen.

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Language: English Series: (NATO Advanced Study Institutes Series : Series B. Physics) ; Vol. 63Publication details: New York: Plenum Press, 1980.Description: XXVI, 589 s. : il. ; 30 cmSubject(s):

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Księgozbiór Podstawowy	Biblioteka Główna Politechniki Częstochowskiej Magazyn Biblioteki Głównej	Z 068408-00-00/01	Checked out	30/09/2023 17:07	04068408000001

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