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Residual Stress : Measurement by Diffraction and Interpretation / Ismail C. Noyan, Jerome B. Cohen.

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Language: English Series: (Materials Research and Engineering)Publication details: New York : Springer Verlag, 1987.Description: X, 276 s. : il. ; 25 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Księgozbiór Podstawowy	Biblioteka Główna Politechniki Częstochowskiej Magazyn Biblioteki Głównej	Z 073602-00-00/01	Checked out	17/12/2024	04073602000001

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