Development and Design with Advanced Materials :  Proceedings of the Second International Conference on Analytical and Testing Methodologies for Design with Advanced Materials (ATMAM) held in Quebec, Montreal, Canada, August 16-18, 1989 / 
Ed. G. C. Sih, S. V. Hoa, J. T. Pindera. 
 - Amsterdam :  Elsevier,  1990. 
 - IX, 332 s. :  il. ;  23 cm. 
<br/><br/>bibliogr. 
<br/><br/><label>ISBN: </label>0444887067 
<br/><br/><label>Uniwersalna Klasyfikacja Dziesiętna: </label> 620.22:061.3