Characterization of Crystal Growth Defects by X-ray Methods / 
ed. Brian K. Tanner, D. Keith Bowen. 
 - New York:  Plenum Press,  1980. 
 - XXVI, 589 s. :  il. ;  30 cm. 
 - (NATO Advanced Study Institutes Series : Series B. Physics)  Vol. 63 .
<br/><br/>bibliogr. 
<br/><br/><label>Uniwersalna Klasyfikacja Dziesiętna: </label> 548.73