| 000 | 00699cam a2200217 i 4500 | ||
|---|---|---|---|
| 001 | pc07034255k | ||
| 008 | 070518s1980 00 eng | ||
| 935 | _a0034-25560 | ||
| 040 | _aCZEST 2/OOZ/AK | ||
| 041 | 0 | _aeng | |
| 080 | _a548.73 | ||
| 245 | 1 | 0 |
_aCharacterization of Crystal Growth Defects by X-ray Methods / _ced. Brian K. Tanner, D. Keith Bowen. |
| 260 |
_aNew York: _bPlenum Press, _c1980. |
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| 300 |
_aXXVI, 589 s. : _bil. ; _c30 cm. |
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| 440 | 0 |
_a(NATO Advanced Study Institutes Series : Series B. Physics) _vVol. 63 |
|
| 504 | _abibliogr. | ||
| 700 | 1 |
_aTanner, Brian K. _eEd. |
|
| 700 | 1 |
_aBowen, D. Keith. _eEd. |
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| 998 | _aKRYSTALOGRAFIA RENTGENOWSKA | ||
| 942 |
_2z _cZ |
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| 999 |
_c34003 _d34003 |
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