Normal view MARC view ISBD view

Characterization of Crystal Growth Defects by X-ray Methods /

Characterization of Crystal Growth Defects by X-ray Methods / ed. Brian K. Tanner, D. Keith Bowen. - New York: Plenum Press, 1980. - XXVI, 589 s. : il. ; 30 cm. - (NATO Advanced Study Institutes Series : Series B. Physics) Vol. 63 .

bibliogr.

Uniwersalna Klasyfikacja Dziesiętna: 548.73

Place hold
Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
NUKAT Inne biblioteki (WorldCat) Inne bazy danych (Google Scholar) Open Library (openlibrary.org)